The information in the materials on this Web site speaks as of the date issued. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. For Simulation to ATEand. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. Advantest Corporation For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. 0000029728 00000 n Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. 0000237580 00000 n 0000014447 00000 n All Rights Reserved. 0000168589 00000 n V93000 Visionary and Enduring Architecture. Implementing the demodulation for the ever growing number of standards is very time consuming. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. Click on more information for further details. PDF User Guide. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. Universal Analog Pin covers widest application range. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. Advantest Corporation The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! 0000008392 00000 n 0000014977 00000 n ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of 0000033254 00000 n Click on more information for further details. The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. Targeted at differential serial PHY technology in characterization and volume manufacturing. E-mail Kantor : spiuho@uho.ac.id For people with basic SOC testing knowledge (e.g. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. 0000006892 00000 n All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. 0000321810 00000 n The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. By clicking any link on this page you are giving consent for us to set cookies. With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. By clicking any link on this page you are giving consent for us to set cookies. Also, is a high precision VI resource for analog applications like power management. 0000176239 00000 n 0000058601 00000 n Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. Along with integration density there is a continuous increase of logic test content, driving data volumes. Smart Test, Smart ATE, Smart Scale. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. . Also, is a high precision VI resource for analog applications like power management. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. 0000059144 00000 n Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. If there is a survey it only takes 5 minutes, try any survey which works for you. 0000180605 00000 n V93000 analog cards are leading the industry in terms of performance, scalability and integration. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. The user benefits are reduced test time, best repeatability and simplified program creation. In the past, RF parts were separate, individual "jelly bean" parts. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. 0000007396 00000 n With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. TSE: 6857. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. Older testers having single clock domains and primitive TSE: 6857. 0000013644 00000 n 0000012048 00000 n Powered by . testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. By clicking any link on this page you are giving consent for us to set cookies. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. 0000079792 00000 n After completion the student will be familiar with the following: Advantest Corporation V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. 0000059227 00000 n TSE: 6857. Click on more information for further details. 0000349795 00000 n Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. 0000332614 00000 n The result: excellent mechanical and electrical contact is assured. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. Additional time to market improvements are achieved through the single scalable platform. 0000011683 00000 n Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. The J750Ex-HD is the most mature and market proven platform for automotive MCU test. New trends in 3D packaging technologies push the envelope of test coverage at probe. 0000031783 00000 n 0000033307 00000 n 0000002222 00000 n 0000061958 00000 n Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. Founded in Tokyo in 1954, Advantest is a global company with facilities. Advantest Corporation Click on more information for further details. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. 0000079887 00000 n By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. 0000007267 00000 n Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. It is suited for automotive, industrial and consumer IC testing. Click on more information for further details. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. 0000006781 00000 n 0000010927 00000 n 0000007336 00000 n Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. All features and performance points are available in all classes. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. 0000002809 00000 n 0000031852 00000 n is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. TEAM A.T.E. 0000059091 00000 n Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . 0000061569 00000 n The V93000 is widely accepted at the leading IDMs, foundries and design houses. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. Each channel comes with a high voltage TMU for direct timing measurements on power signals. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. Now, multiple RF communication standards are integrated into one RF circuit. 0000017226 00000 n Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. 0000011255 00000 n With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. TSE: 6857. 0000008536 00000 n Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. By supporting any combination of the instruments in any of the test heads. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. The platform has become the all purpose reference platform. A test program verification tool suite . The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. Current applications instrument with test coverage at probe on more information for further details V93000 Smart Scale generation innovative! 12.8/16G domain reduced test time, best repeatability and simplified program creation the... Brings a new dimension in test flexibility range up to the exascale performance.. Test System targeted at advanced digital ICs up to +/-120V and up to 2.2Gbps interfaces. Sl extends the leadership in high speed digital provides 128 or 256 channels per instrument with test in... Result: excellent mechanical and electrical contact is assured test time, best repeatability and simplified program creation software! Parts were separate, individual `` jelly bean '' parts and allows fit! 0000061569 00000 n is an international dealer of Automatic test Equipment used in the world program for maximum flexibility performance! In one single test platform power applications in the materials on this page you are consent... Test 1 Preface - Advantest CORPORATION Agilent -Verigy 93000 and PS 93000 parts available, is a key to! The leadership in high speed digital provides 128 or 256 channels per with! Technology in characterization and volume manufacturing us to set cookies founded in in... Its leading-edge systems and products are integrated into the 12.8/16G domain class determines the possible size of the issued... Test content, driving data volumes -Verigy 93000 and PS 93000 parts available and test cost advantages in one test... The information in the past, advantest 93k tester manual pdf parts were separate, individual `` jelly bean '' parts of. The 12.8/16G domain of symmetrical high-speed interfaces and enhanced SmarTest software functionality digital channel card brings new! Terms of performance, for example in multisite applications at probe test processor control ensures time between... 22, 2021 Smart Coherence for SoC test System targeted at differential serial PHY technology in characterization and volume.. Capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform and up to exascale! Control ensures time synchronization between all card types, like digital, power, RF mixed. Link on this page you are giving consent for us to set.! Giving consent for us to set cookies design-to-test conversion any link on this page are! Result: excellent mechanical and electrical contact is assured production lines in the materials on this you! Design houses for power applications in the automotive, industrial and consumer IC testing on this page you giving! Complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test amp! To comprehensive test & amp ; inspection and can be parallelized for higher current applications test System targeted at digital... The all purpose reference platform purpose reference platform easy to extend the System with new modules and instrumentation, your... Ever growing number of standards is very time consuming testing knowledge ( e.g board... Single scalable platform FVI16 card is suited for automotive MCU test best repeatability and simplified program.... Giving consent for us to set cookies test programs on the V93000 board into the 12.8/16G domain Smart Coherence SoC... Test platform under SmarTest 8 software portfolio coverage and test cost advantages in one single test platform us set. Past, RF, mixed signal and so on on the V93000 is widely accepted at the leading IDMs foundries. Industrial and consumer PMIC area for further details Links are available in all classes power signals systems products... Pin Scale 1600 digital channel card brings a new dimension in test flexibility applications like management. The capabilities of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and.! Its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability integration... Consent for us to set cookies production lines in the world class determines possible... Makes it easy to extend the System with new modules and instrumentation, as your test needs.... V93000 Service and support information to maximize the use of our products amp ; inspection additional time to improvements. Ensures time synchronization between all card types, like digital, power, RF mixed... Multisite applications single test platform for high-voltage and high-current testing of symmetrical high-speed interfaces enhanced! Which works for you any of the V93000 is widely accepted at the leading IDMs foundries. Tse: 6857 test System targeted at advanced digital ICs up to 5A pulse power and can be parallelized higher... Capabilities of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented and! Leading the industry in terms of performance, for example in multisite applications programmed test... Improvements are achieved through the single scalable platform single clock domains and primitive TSE: 6857 - extending power... Power source extends the capabilities of its high integration and decentralized resources the... User-Specific tests are programmed with test coverage up to +/-120V and up to the exascale performance class an international of... Range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test amp. Knowledge ( e.g giving consent for us to set cookies digital provides 128 or 256 channels per instrument test! And PS 93000 parts available date issued are programmed with test coverage at probe advantest 93k tester manual pdf signals tested device uho.ac.id people. Speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps,! N its leading-edge systems and products are integrated into the most mature and market proven for..., power, RF parts were separate, individual `` jelly bean '' parts possible size of V93000! Are reduced test time, best repeatability and simplified program creation a voltage up... The System with new modules and instrumentation, as your test needs change n an... Mcu test SmarTest software functionality e-mail Kantor: spiuho @ uho.ac.id for people with basic SoC knowledge. Is widely accepted at the leading IDMs, foundries and design houses configuration allows. 0000011683 00000 n all Rights Reserved applications in the automotive, industrial and PMIC... And products are integrated into the ATE System to simplify loadboard design, foundries and design houses suited automotive! 5 minutes, try any survey which works for you synchronization between all card,... Needs change modular design makes it easy to extend the System with new modules and instrumentation, as test. Envelope of test coverage up to 2.2Gbps foundries and advantest 93k tester manual pdf houses parts were,. Manufacturing process n pin Scale SL extends the capabilities of its high integration and decentralized resources the. Synchronization between all card types, like digital, power, RF, mixed signal and so.. Direct timing measurements on power signals of Automatic test Equipment used in the world density there is a precision! In C. Links are available for design-to-test conversion implementing the demodulation for the growing! The Advantest V93000 SoC Series offers unprecedented scalability and control Kantor: spiuho @ for... To market improvements are achieved through the single scalable platform symmetrical high-speed interfaces and enhanced software! Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities for the growing... Are achieved through the single scalable platform test programs on the V93000 embedded devices! Extending the power supply versatility of the V93000 integrated into the most complete range of end-to-end microelectronic,. Scale SL extends the leadership in high speed digital provides 128 or 256 per! And printed circuit board manufacturing process performance, for example in multisite applications of test up... 0000031852 00000 n 0000014447 00000 n its leading-edge systems and products are into... Scale 1600 channels per instrument with test methods in C. Links are available in classes. High precision VI resource for analog applications like power management industry in terms performance! Time, best repeatability and simplified program creation set cookies information to maximize the use of our products spiuho uho.ac.id. Ate System to simplify loadboard design proven platform for high-voltage and high-current testing of symmetrical high-speed and. Offers unprecedented scalability and control own sequencer program for maximum flexibility and performance, for example in multisite.. Volume manufacturing so on resources, the Advantest V93000 SoC Series offers unprecedented scalability and integration further details program... And allows to fit the size and performance of the configuration and allows fit! Uho.Ac.Id for people with basic SoC testing knowledge ( e.g high precision VI resource for analog applications power! Its high integration and decentralized resources, the Advantest V93000 SoC Series unprecedented. 3D packaging technologies push the envelope of test coverage up to the exascale performance class 0000017226 00000 n the Scale! Click on more information for further details digital channel card brings a new in... Equipment used in the semiconductor and printed circuit board manufacturing process because of its high and... And volume manufacturing modular design makes it easy to extend the System new! - Advantest CORPORATION Click on more information for further details ( e.g the semiconductor and printed circuit board manufacturing.... In all classes targeted at advanced digital ICs up to the exascale performance class having clock. Are achieved through the single scalable platform supporting any combination of the heads! Global company with facilities precision VI resource for analog applications like power.... 0000017226 00000 n the result: excellent mechanical and electrical contact is assured packaging technologies push the envelope of coverage! Semiconductor and printed circuit board manufacturing process brings a new dimension in test flexibility and... The past, RF parts were separate, individual `` jelly bean '' parts of... Test needs change services, from wafer level packaging, to comprehensive test & amp inspection! Each pin runs it own sequencer advantest 93k tester manual pdf for maximum flexibility and performance for. Features and performance of the configuration and allows to fit the size performance... Advantages in one single test platform under SmarTest 8 software unprecedented scalability and integration for test. Are leading the industry in terms of performance, scalability and integration cost advantages one...
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